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device property: Drop 'test' prefix in parameters of fwnode_is_ancestor_of()

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The part 'is' in the function name implies the test against something.
Drop unnecessary 'test' prefix in the fwnode_is_ancestor_of() parameters.

No functional change intended.

Signed-off-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com>
Reviewed-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Rafael J. Wysocki <rafael.j.wysocki@intel.com>
This commit is contained in:
Andy Shevchenko 2022-04-08 21:48:42 +03:00 • committed by Rafael J. Wysocki
parent 87ffea0947
commit 022fe6bc8f
2 changed files with 10 additions and 13 deletions
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3
include/linux/property.h
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@ -95,8 +95,7 @@ struct device *fwnode_get_next_parent_dev(struct fwnode_handle *fwnode);
unsigned int fwnode_count_parents(const struct fwnode_handle *fwn);
struct fwnode_handle *fwnode_get_nth_parent(struct fwnode_handle *fwn,
unsigned int depth);
bool fwnode_is_ancestor_of(struct fwnode_handle *test_ancestor,
struct fwnode_handle *test_child);
bool fwnode_is_ancestor_of(struct fwnode_handle *ancestor, struct fwnode_handle *child);
struct fwnode_handle *fwnode_get_next_child_node(
const struct fwnode_handle *fwnode, struct fwnode_handle *child);
struct fwnode_handle *fwnode_get_next_available_child_node(